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  • News and Events
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Customer Successes
In The News
News Releases
Events
Process Optimization 2011
AEC/APC Europe 2010
AEC/APC North America 2010

             

             
Recognition by the media, standards organizations, and our customers

 

News Releases

  • PEER Factory Acceptance Tester (PFAT™) Release Updates

    14 December 2011

  • PEER Group's FAST FW™ Release Updates

    14 December 2011

  • EIB™ OEM Product Suite Release Updates

    14 December 2011

  • NexEDA™ Release Updates

    16 November 2011

  • PTO 5.0 Advances Tool Automation Software Technology

    31 October 2011

  • Connectivity Upgrades for PV2, Reticle and Data Optimization

    29 July 2011

  • View all >>

In The News

  • PEER Group's software architect, Terry Young, recognized for contributions to Microsoft Prism Project
    11 November 2010

  • Picosun launches automated ALD cluster system
    20 June 2010

  • EU PVSEC: SEMI Europe Standards Merit Award 2009 goes to PV EIS Taskforce
    22 September 2009

  • PEER Group Acquires Asyst's Software Products
    2 September 2009

  • PEER Group Acquiring Asyst's Connectivity Software Products
    6 August 2009

  • View all >>

Events

  • Process Optimization Workshop 
    Semptember 15 2011

  • View all >>

Customer Successes

  • Metrology supplier meets challenging automation specifications of memory fab

  • New Vacuum Platform Delivers Flexible Wafer Scheduling and Advanced Data Collection

  • Bruker Delivers Fully Automated Tool in Three Months

  • Rudolph Improves Equipment Reliability

  • View all >>

 

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