Equipment automation tests for rapid fab acceptance and integration

Protocol‑independent testing

Multiple connection interfaces (SECS‑II/HSMS, E84, E87) with a core set of generic test instructions.

Extensible, future-proof architecture

Add new and emerging interfaces as they become available.

Designed for SECS/GEM, SEMI E84, and SEMI E87

Validate automation behavior and data for SEMI E30 (GEM), E84 (PI/O), and E87 (Carrier Management) use cases using configurable message templates, data setup, and runtime checks.

Parallel and synchronized executions

Model realistic scenarios with Split, Split Wait, Synchronize, and Set Synchronization Point. Define End/Pass criteria and timeouts and repeat flows with Loop (for/while/do‑while).

Linked, embedded, and nested test plans

Build complex scenarios by linking test plans, running branches in parallel, and exporting all dependencies as a shareable package.

Dynamic message templates & SML

Author reusable SECS/HSMS message templates with dynamic lists and parameters that expand on send/receive with the option to include custom and ad‑hoc messages.

Test run manager

Automatically store every run, switch between runs (including a merged summary), rename or delete runs, and compare results at a glance.

Test plan comparison

Compare two sessions to see differences, similarities, and missing/added details and export comparison results for reviews and audits.

Data setup wizard

Query equipment to pull CEID/SVID/ECID/ALID/VID lists and pair IDs to setup names; import/export data setups (XML/CSV with mapping) and validate at runtime.

Logging and visualization

Consolidated session log with SECS/HSMS/E84 entries (optionally including hex/control frames), generate reports and visualize E84 signal charts, and sequence diagrams for forensics and sign-off.